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ria9781848219366_rkm

Ria Christie English Books

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Uxbridge, GB

Nanometerscale Defect Detection Using Polarized Light by PR Dahoo

2 In stock
AUTHOR : P R Dahoo
TYPE : Hardback
PUBLISHER : ISTE Press
LANGUAGE : English
PUBLISHED : Aug 2016
PAGES : 316

Nanometerscale Defect Detection Using Polarized Light by PR Dahoo

£12613
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Description Features Reviews
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories polarization states and interactions of light with matter in particular optical techniques using polarized light.
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